|
| Youhua SHI
|
An FPGA-Based YOLOv6 Accelerator for High-Throughput and Energy-Efficient Object Detection
Xingan SHA Masao YANAGISAWA Youhua SHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2025/03/01
Vol. E108-A
No. 3
pp. 473-481
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
object detection, CNN, YOLOv6, FPGA, accelerator, | | | Summary | Full Text:PDF | |
| |
|
|
A Low Power Soft Error Hardened Latch with Schmitt-Trigger-Based C-Element
Saki TAJIMA Nozomu TOGAWA Masao YANAGISAWA Youhua SHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2018/07/01
Vol. E101-A
No. 7
pp. 1025-1034
Type of Manuscript:
Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category:
Keyword:
soft error, low-power, latch, C-element, | | | Summary | Full Text:PDF | |
| |
|
| |
|
| |
|
| |
|
| |
|
| |
|
|
X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A
No. 12
pp. 3119-3127
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword:
scan test, test data compression, X-masking, | | | Summary | Full Text:PDF | |
| |
|
|
A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A
No. 12
pp. 3514-3523
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword:
scan test, test data compression, X-masking, | | | Summary | Full Text:PDF | |
| |
|
| |
|
| |
|
| |
|
| |
|
|
|