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A Secure Test Technique for Pipelined Advanced Encryption Standard
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: Special Section LETTER (Special Section on Test and Verification of VLSIs)
scan test, security, test quality,
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In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.