Keyword : test quality


Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation
Fuqiang LI Xiaoqing WEN Kohei MIYASE Stefan HOLST Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12 ; pp. 2310-2319
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
at-speed scan testingIR-dropcapture-power-safetylogic pathclock pathclock stretchtest quality
 Summary | Full Text:PDF

A Secure Test Technique for Pipelined Advanced Encryption Standard
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 776-780
Type of Manuscript:  Special Section LETTER (Special Section on Test and Verification of VLSIs)
Category: 
Keyword: 
scan testsecuritytest quality
 Summary | Full Text:PDF