Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/25 Vol. E81-DNo. 7pp. 749-752 Type of Manuscript: Special Section LETTER (Special Issue on Test and Diagnosis of VLSI) Category: Keyword: Josephson logic circuit, test, defect coverage,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/25 Vol. E78-DNo. 7pp. 817-821 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: fault diagnosis, bridging fault, CMOS, combinational circuit,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1993/07/25 Vol. E76-DNo. 7pp. 826-831 Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design) Category: Keyword: fault diagnosis, gate-level fault, combinational circuit, probing,