Keyword : Josephson logic circuit


On Testing of Josephson Logic Circuits Composed of the 4JL Gates
Teruhiko YAMADA Tsuyoshi SASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 749-752
Type of Manuscript:  Special Section LETTER (Special Issue on Test and Diagnosis of VLSI)
Category: 
Keyword: 
Josephson logic circuittestdefect coverage
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