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IEICE Trans

Makoto SAEN


Soft-Error-Tolerant Dual-Modular-Redundancy Architecture with Repair and Retry Scheme for Memory-Control Circuit on FPGA
Makoto SAEN Tadanobu TOBA Yusuke KANNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2017/04/01
Vol. E100-C  No. 4  pp. 382-390
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
FPGAsoft-error tolerancememory controllerconfiguration RAM
 Summary | Full Text:PDF

A Stochastic Associative Memory Using Single-Electron Tunneling Devices
Makoto SAEN Takashi MORIE Makoto NAGATA Atsushi IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/01/25
Vol. E81-C  No. 1  pp. 30-35
Type of Manuscript:  Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices)
Category: 
Keyword: 
associative memorysingle-electron tunnelingSETsingle-electron transistor
 Summary | Full Text:PDF