Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/05/01 Vol. E96-DNo. 5pp. 1219-1222 Type of Manuscript: LETTER Category: Dependable Computing Keyword: small delay faults, test coverage, flip-flop, clock pulse,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/08/01 Vol. E92-DNo. 8pp. 1534-1541 Type of Manuscript: PAPER Category: Dependable Computing Keyword: soft error, wide pulse, flip-flop, C-element, delay element,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-DNo. 5pp. 1687-1693 Type of Manuscript: PAPER Category: Dependable Computing Keyword: multi-context FPGA, single stuck-at fault, design for testability,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/12/01 Vol. E88-DNo. 12pp. 2777-2785 Type of Manuscript: PAPER Category: Dependable Computing Keyword: two-pattern testing, delay fault testing, scan design, enhanced scan,