Keyword : enhanced scan


Scan Design for Two-Pattern Test without Extra Latches
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12 ; pp. 2777-2785
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
two-pattern testingdelay fault testingscan designenhanced scan
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