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Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test
Yusuke YAMAGA Chihiro MATSUI Yukiya SAKAKI Ken TAKEUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2018/04/01
Vol. E101-C
No. 4
pp. 243-252
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category:
Keyword:
solid-state drive, reliability, NAND flash memory, | | | Summary | Full Text:PDF | |
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Workload-Based Co-Design of Non-Volatile Cache Algorithm and Storage Class Memory Specifications for Storage Class Memory/NAND Flash Hybrid SSDs
Tomoaki YAMADA Chihiro MATSUI Ken TAKEUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2017/04/01
Vol. E100-C
No. 4
pp. 373-381
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category:
Keyword:
solid-state drive, storage class memory, NAND flash memory, | | | Summary | Full Text:PDF | |
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