Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/06/01 Vol. E87-ANo. 6 ;
pp. 1330-1337 Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003)) Category: Keyword: lead open, CMOS LSI, supply current test, electric field,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 537-543 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: IDDQ testing, bridging faults, switching current, supply current test, CMOS circuits,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2003/12/01 Vol. E86-DNo. 12 ;
pp. 2666-2673 Type of Manuscript: Special Section PAPER (Special Issue on Dependable Computing) Category: Test Keyword: open defects, supply current test, CMOS circuits, electric field,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-DNo. 10 ;
pp. 1542-1550 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Current Test Keyword: open defect, CMOS, supply current test, electric field,