Masahiro ICHIMIYA

Lead Open Detection Based on Supply Current of CMOS LSIs
Masao TAKAGI Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/06/01
Vol. E87-A  No. 6  pp. 1330-1337
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003))
Category: 
Keyword: 
lead open, CMOS LSI, supply current test, electric field, 
 Summary | Full Text:PDF
IDDQ Test Time Reduction by High Speed Charging of Load Capacitors of CMOS Logic Gates
Masaki HASHIZUME Teppei TAKEDA Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Yukiya MIURA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1534-1541
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Current Test
Keyword: 
IDDQ sensor, CMOS, IDDQ test, bridging fault, 
 Summary | Full Text:PDF
CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1542-1550
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Current Test
Keyword: 
open defect, CMOS, supply current test, electric field, 
 Summary | Full Text:PDF