Keyword : open defect


A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs
Widiant Masaki HASHIZUME Shohei SUENAGA Hiroyuki YOTSUYANAGI Akira ONO Shyue-Kung LU Zvi ROTH 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/11/01
Vol. E99-D  No. 11 ; pp. 2723-2733
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
electrical testbuilt-in test circuitopen defectinterconnect testdesign for testability
 Summary | Full Text:PDF

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 551-556
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current testfloating gate defectopen defectdefect detection
 Summary | Full Text:PDF

CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1542-1550
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Current Test
Keyword: 
open defectCMOSsupply current testelectric field
 Summary | Full Text:PDF