Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/12/01 Vol. E88-DNo. 12 ;
pp. 2777-2785 Type of Manuscript: PAPER Category: Dependable Computing Keyword: two-pattern testing, delay fault testing, scan design, enhanced scan,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1997/10/25 Vol. E80-ANo. 10 ;
pp. 1934-1944 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: scannable memory configuration, memory array testing, design-for-testability, scan design,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/10/25 Vol. E76-ANo. 10 ;
pp. 1676-1683 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: test generation, scan design, test application time, boolean function manipulation,