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IEICE Trans

Keyword : partial good chip

Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression
Anis UZZAMAN Brion KELLER Brian FOUTZ Sandeep BHATIA Thomas BARTENSTEIN Masayuki ARAI Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 17-23
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
test compression, hybrid compression, volume diagnosis, ATPG, partial good chip, 
 Summary | Full Text:PDF