Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 551-556 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Fault Detection Keyword: current test, floating gate defect, open defect, defect detection,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-DNo. 10 ;
pp. 1542-1550 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Current Test Keyword: open defect, CMOS, supply current test, electric field,