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IEICE Trans

Keyword : random variability

Substrate-Noise and Random-Variability Reduction with Self-Adjusted Forward Body Bias
Yoshihide KOMATSU Koichiro ISHIBASHI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4 ; pp. 692-698
Type of Manuscript:  Special Section PAPER (Special Section on Low-Power, High-Speed LSIs and Related Technologies)
Category: Digital
Keyword: 
substrate noise, random variability, forward body bias, self adjusted, impurities, latch-up, CMOS, SoC, 
 Summary | Full Text:PDF