Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C
No. 4 ;
pp. 692-698
Type of Manuscript:
Special Section PAPER (Special Section on Low-Power, High-Speed LSIs and Related Technologies)
Category: Digital
Keyword:
substrate noise, random variability, forward body bias, self adjusted, impurities, latch-up, CMOS, SoC, |