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Electrothermal Analysis of Latch-Up in an Insulated Gate Transistor (IGT) Hermann BRAND Siegfried SELBERHERR | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C
No. 2 ;
pp. 179-186
Type of Manuscript:
Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Device Simulation Keyword: simulation, latch-up, IGT, thermodynamic, entropy, | | Summary | Full Text:PDF | |
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