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| Keyword : degradation
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Panel Structural Factors and Luminance Degradation of PDP Phosphors
Teruo KURAI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2002/07/01
Vol. E85-C
No. 7 ;
pp. 1506-1515
Type of Manuscript:
PAPER
Category: Electronic Displays
Keyword:
PDP, phosphors, degradation, ion-bombardment, | | | Summary | Full Text:PDF | |
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Polarization Fatigue Modeling of Ferroelectric Capacitors
Kiyoshi NISHIMURA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2002/06/01
Vol. E85-C
No. 6 ;
pp. 1334-1341
Type of Manuscript:
PAPER
Category: Microwaves, Millimeter-Waves
Keyword:
ferroelectric, fatigue, degradation, model, NVRAM, | | | Summary | Full Text:PDF | |
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Optoelectronic Integrated Circuits Grown on Si Substrates
Takashi EGAWA Takashi JIMBO Masayoshi UMENO | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C
No. 1 ;
pp. 106-111
Type of Manuscript:
INVITED PAPER (Special Issue on Opto-Electronics and LSI)
Category: Integration of Opto-Electronics and LSI Technologies
Keyword:
GaAs/Si, OEIC, laser, degradation, MOCVD, | | | Summary | Full Text:PDF | |
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