Polarization Fatigue Modeling of Ferroelectric Capacitors


IEICE TRANSACTIONS on Electronics   Vol.E85-C   No.6   pp.1334-1341
Publication Date: 2002/06/01
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwaves, Millimeter-Waves
ferroelectric,  fatigue,  degradation,  model,  NVRAM,  

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We developed a novel model for degradation of remanent polarization resulting from repeated polarization reversal cycling. The characteristics of ferroelectric capacitors have been simulated with the double saturation function model that required only five parameters; Ec, Qrmax, Qdmax, Kr and Kd. This novel model combines an equivalent gap capacitor with the double saturation function model. The model predicts hysteresis loops under endurance conditions. The simulated results are well in agreement with the results obtained in the experiment. The model is utilized to quantify the degradation effect of remanent polarization on ferroelectric memory applications.