Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C
No. 5 ;
pp. 842-846
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
RRAM, conductive defect, cell thickness, reset current, set voltage, forming voltage, and low power, |