Sunghun JUNG


Resistive Switching Characteristics of Silicon Nitride-Based RRAM Depending on Top Electrode Metals
Sungjun KIM Sunghun JUNG Min-Hwi KIM Seongjae CHO Byung-Gook PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/05/01
Vol. E98-C  No. 5  pp. 429-433
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
RRAMswitching and conduction mechanismtop electrode (TE)
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Effects of Conductive Defects on Unipolar RRAM for the Improvement of Resistive Switching Characteristics
Kyung-Chang RYOO Jeong-Hoon OH Sunghun JUNG Hyungjin KIM Byung-Gook PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5  pp. 842-846
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
RRAMconductive defectcell thicknessreset currentset voltageforming voltageand low power
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A New Approximation of the Receive Minimum Distance and Its Application to MIMO Systems
Sunghun JUNG Myeongcheol SHIN Hee-Young PARK Chungyong LEE 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/02/01
Vol. E90-B  No. 2  pp. 385-387
Type of Manuscript:  LETTER
Category: Wireless Communication Technologies
Keyword: 
receive minimum distanceapproximationminimum singular valuedeterminantmaximum likelihood detection
 Summary | Full Text:PDF