Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C
No. 4 ;
pp. 705-708
Type of Manuscript:
Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Nanomaterials and Quantum-Effect Devices Keyword: nanocrystal, AFM, conducting probe, local characterization, |