Keyword : local characterization


Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique
Katsunori MAKIHARA Yoshihiro OKAMOTO Hideki MURAKAMI Seiichiro HIGASHI Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4 ; pp. 705-708
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Nanomaterials and Quantum-Effect Devices
Keyword: 
nanocrystalAFMconducting probelocal characterization
 Summary | Full Text:PDF

Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
Kazuhiro KUDO Masaaki IIZUKA Shigekazu KUNIYOSHI Kuniaki TANAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/07/25
Vol. E83-C  No. 7 ; pp. 1069-1070
Type of Manuscript:  Special Section LETTER (Special Issue on Organic Molecular Electronics for the 21st Century)
Category: Ultra Thin Film
Keyword: 
atomic force microscopylocal characterizationTTFTCNQorganic films
 Summary | Full Text:PDF