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IEICE Trans

Keyword : atomic force microscopy

Investigation on the Vertical Alignment Transition by UV-Irradiation after Slit-Coating of UV-Curable Mesogen-Added Liquid Crystals
Yuki IMAMURA Daiki FUJII Yuki ENOMOTO Yuichi UENO Yosei SHIBATA Munehiro KIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2025/02/01
Vol. E108-C  No. 2 ; pp. 92-98
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
UV-curable mesogen, slit coater, surface orientation, surface energy, atomic force microscopy, 
 Summary | Full Text:PDF
Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces
Masahiro KONDA Akinobu TERAMOTO Tomoyuki SUWA Rihito KURODA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 664-670
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
atomically flat silicon surfaces, off angle, atomic force microscopy, 
 Summary | Full Text:PDF
Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
Kazuhiro KUDO Masaaki IIZUKA Shigekazu KUNIYOSHI Kuniaki TANAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/07/25
Vol. E83-C  No. 7 ; pp. 1069-1070
Type of Manuscript:  Special Section LETTER (Special Issue on Organic Molecular Electronics for the 21st Century)
Category: Ultra Thin Film
Keyword: 
atomic force microscopy, local characterization, TTF, TCNQ, organic films, 
 Summary | Full Text:PDF