Keyword : TTF


Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
Kazuhiro KUDO Masaaki IIZUKA Shigekazu KUNIYOSHI Kuniaki TANAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/07/25
Vol. E83-C  No. 7 ; pp. 1069-1070
Type of Manuscript:  Special Section LETTER (Special Issue on Organic Molecular Electronics for the 21st Century)
Category: Ultra Thin Film
Keyword: 
atomic force microscopylocal characterizationTTFTCNQorganic films
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