Keyword : atomic force microscopy


Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces
Masahiro KONDA Akinobu TERAMOTO Tomoyuki SUWA Rihito KURODA Tadahiro OHMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 664-670
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
atomically flat silicon surfacesoff angleatomic force microscopy
 Summary | Full Text:PDF

Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
Kazuhiro KUDO Masaaki IIZUKA Shigekazu KUNIYOSHI Kuniaki TANAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/07/25
Vol. E83-C  No. 7 ; pp. 1069-1070
Type of Manuscript:  Special Section LETTER (Special Issue on Organic Molecular Electronics for the 21st Century)
Category: Ultra Thin Film
Keyword: 
atomic force microscopylocal characterizationTTFTCNQorganic films
 Summary | Full Text:PDF