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IEICE Trans

Keyword : I/O buffer

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM Su-Jin PARK Yong-Ki KIM Sang-Keun HAN Young-Hyun JUN Chilgee LEE Tae Hee HAN Bai-Sun KONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5 ; pp. 709-711
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-voltage, I/O buffer, gate-oxide reliability, leakage current, hot-carrier degradation, 
 Summary | Full Text:PDF