Keyword : hot-carrier degradation

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM Su-Jin PARK Yong-Ki KIM Sang-Keun HAN Young-Hyun JUN Chilgee LEE Tae Hee HAN Bai-Sun KONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5 ; pp. 709-711
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-voltage, I/O buffer, gate-oxide reliability, leakage current, hot-carrier degradation, 
 Summary | Full Text:PDF
Two-Dimensional Simulation of Electric Field and Carrier Concentration of Low-Temperature N-Channel Poly-Si LDD TFTs
Yukisato NOGAMI Toshifumi SATOH Hiroyuki TANGO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5 ; pp. 983-987
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Junction Formation and TFT Reliability
Keyword: 
n-channel poly-Si LDD TFT, device simulation, electric field distribution, carrier concentration distribution, hot-carrier degradation, 
 Summary | Full Text:PDF
Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design
Peter M. LEE Tsuyoshi SEO Kiyoshi ISE Atsushi HIRAISHI Osamu NAGASHIMA Shoji YOSHIDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 595-601
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carrier degradation, reliability, device lifetime, circuit simulation, SRAM, DRAM, 
 Summary | Full Text:PDF