Keyword : gate-oxide reliability

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM Su-Jin PARK Yong-Ki KIM Sang-Keun HAN Young-Hyun JUN Chilgee LEE Tae Hee HAN Bai-Sun KONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5 ; pp. 709-711
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-voltage, I/O buffer, gate-oxide reliability, leakage current, hot-carrier degradation, 
 Summary | Full Text:PDF
Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3 ; pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
gate-oxide reliability, sample-and-hold amplifier, dielectric breakdown, bootstrapped switch, switched-capacitor circuit, 
 Summary | Full Text:PDF