Keyword : gate-oxide reliability

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM Su-Jin PARK Yong-Ki KIM Sang-Keun HAN Young-Hyun JUN Chilgee LEE Tae Hee HAN Bai-Sun KONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5 ; pp. 709-711
Type of Manuscript:  LETTER
Category: Integrated Electronics
mixed-voltageI/O buffergate-oxide reliabilityleakage currenthot-carrier degradation
 Summary | Full Text:PDF

Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3 ; pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
gate-oxide reliabilitysample-and-hold amplifierdielectric breakdownbootstrapped switchswitched-capacitor circuit
 Summary | Full Text:PDF