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Keyword : gate-oxide reliability
New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM
Su-Jin PARK
Yong-Ki KIM
Sang-Keun HAN
Young-Hyun JUN
Chilgee LEE
Tae Hee HAN
Bai-Sun KONG
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2010/05/01
Vol.
E93-C
No.
5
;
pp.
709-711
Type of Manuscript:
LETTER
Category:
Integrated Electronics
Keyword:
mixed-voltage
,
I/O buffer
,
gate-oxide reliability
,
leakage current
,
hot-carrier degradation
,
Summary
|
Full Text:PDF
Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN
Ming-Dou KER
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2008/03/01
Vol.
E91-C
No.
3
;
pp.
378-384
Type of Manuscript:
PAPER
Category:
Electronic Circuits
Keyword:
gate-oxide reliability
,
sample-and-hold amplifier
,
dielectric breakdown
,
bootstrapped switch
,
switched-capacitor circuit
,
Summary
|
Full Text:PDF