Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2022/05/01 Vol. E105-DNo. 5 ;
pp. 996-1009 Type of Manuscript: PAPER Category: Dependable Computing Keyword: soft-error, hardened latch, defect, scan test,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2012/12/01 Vol. E95-ANo. 12 ;
pp. 2347-2356 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: High-Level Synthesis and System-Level Design Keyword: FPGA, partial reconfiguration, fault-injection analysis, soft-error, dependability,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 179-184 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: soft-error, 1-volt, multi-threshold, CMOS, memory,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/25 Vol. E77-CNo. 3 ;
pp. 399-405 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Device Technology Keyword: soft-error, DRAM, microprobe, proton, mapping,