Keyword : soft-error


Area-Efficient Soft-Error Tolerant Datapath Synthesis Based on Speculative Resource Sharing
Junghoon OH Mineo KANEKO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1311-1322
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
speculative resource sharingsoft-errorfault tolerant datapathtriple algorithm redundancyhigh-level synthesisinteger linear programming
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Fault-Injection Analysis to Estimate SEU Failure in Time by Using Frame-Based Partial Reconfiguration
Yoshihiro ICHINOMIYA Tsuyoshi KIMURA Motoki AMAGASAKI Morihiro KUGA Masahiro IIDA Toshinori SUEYOSHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12 ; pp. 2347-2356
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
FPGApartial reconfigurationfault-injection analysissoft-errordependability
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Evaluation of Soft-Error Immunity for 1-V CMOS Memory Cells with MTCMOS Technology
Takakuni DOUSEKI Shin'ichiro MUTOH Takemi UEKI Junzo YAMADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 179-184
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
soft-error1-voltmulti-thresholdCMOSmemory
 Summary | Full Text:PDF

Soft-Error Study of DRAMs with Retrograde Well Structure by New Evaluation Method
Yoshikazu OHNO Hiroshi KIMURA Ken-ichiro SONODA Tadashi NISHIMURA Shin-ichi SATOH Hirokazu SAYAMA Shigenori HARA Mikio TAKAI Hirokazu MIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 399-405
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
soft-errorDRAMmicroprobeprotonmapping
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