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IEICE Trans

Yuuich TAKAHASHI

Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems
Haruo KOBAYASHI Kensuke KOBAYASHI Masanao MORIMURA Yoshitaka ONAYA Yuuich TAKAHASHI Kouhei ENOMOTO Hideyuki KOGURE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/02/01
Vol. E85-A  No. 2  pp. 335-346
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
jitter, phase noise, aperture time, aperture window, sampling, equivalent-time sampling, ADC, track/hold circuit, digitizing oscilloscope, 
 Summary | Full Text:PDF