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Sampling Jitter and Finite Aperture Time Effects in Wideband Data Acquisition Systems
Haruo KOBAYASHI Kensuke KOBAYASHI Masanao MORIMURA Yoshitaka ONAYA Yuuich TAKAHASHI Kouhei ENOMOTO Hideyuki KOGURE
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/02/01
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
jitter, phase noise, aperture time, aperture window, sampling, equivalent-time sampling, ADC, track/hold circuit, digitizing oscilloscope,
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This paper presents an explicit analysis of the output error power in wideband sampling systems with finite aperture time in the presence of sampling jitter. Sampling jitter and finite aperture time affect the ability of wideband sampling systems to capture high-frequency signals with high precision. Sampling jitter skews data acquisition timing points, which causes large errors in high-frequency (large slew rate) signal acquisition. Finite sampling-window aperture works as a low pass filter, and hence it degrades the high-frequency performance of sampling systems. In this paper, we discuss these effects explicitly not only in the case that either sampling jitter or finite aperture time exists but also the case that they exist together, for any aperture window function (whose Fourier transform exists) and sampling jitter of Gaussian distribution. These would be useful for the designer of wideband sampling data acquisition systems to know how much sampling jitter and aperture time are tolerable for a specified SNR. Some experimental measurement results as well as simulation results are provided as validation of the analytical results.