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IEICE Trans

Yu-Ching LI

Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration
Cheng-Yu HAN Yu-Ching LI Hao-Tien KAN James Chien-Mo LI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12  pp. 2320-2327
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
IR-drop, power-supply-noise, timing analysis, testing, 
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