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IEICE Trans

Takeshi ASAKAWA

Hybrid BIST Design for n-Detection Test Using Partially Rotational Scan
Kenichi ICHINO Takeshi ASAKAWA Satoshi FUKUMOTO Kazuhiko IWASAKI Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1490-1497
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
hybrid BIST, unmodeled fault, n-detection test, partially rotational scan, at-speed testing, 
 Summary | Full Text:PDF