Keyword : hybrid BIST

Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits
Kenichi ICHINO Ko-ichi WATANABE Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 586-591
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Scan Testing
Keyword: 
hybrid BIST, n-detection test, partially rotational scan, low-speed tester, 
 Summary | Full Text:PDF
Hybrid BIST Design for n-Detection Test Using Partially Rotational Scan
Kenichi ICHINO Takeshi ASAKAWA Satoshi FUKUMOTO Kazuhiko IWASAKI Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1490-1497
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword: 
hybrid BIST, unmodeled fault, n-detection test, partially rotational scan, at-speed testing, 
 Summary | Full Text:PDF