Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D
No. 10 ;
pp. 1490-1497
Type of Manuscript:
Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: BIST
Keyword:
hybrid BIST, unmodeled fault, n-detection test, partially rotational scan, at-speed testing, |
