Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2022/05/01 Vol. E105-DNo. 5pp. 996-1009 Type of Manuscript: PAPER Category: Dependable Computing Keyword: soft-error, hardened latch, defect, scan test,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12pp. 2310-2319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: at-speed scan testing, IR-drop, capture-power-safety, logic path, clock path, clock stretch, test quality,