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IEICE Trans

Ryota SAKAI

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testing, ATPG, IR-drop, test power reduction, low power test, 
 Summary | Full Text:PDF