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IEICE Trans

Kyung-Chang RYOO

Effects of Conductive Defects on Unipolar RRAM for the Improvement of Resistive Switching Characteristics
Kyung-Chang RYOO Jeong-Hoon OH Sunghun JUNG Hyungjin KIM Byung-Gook PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5  pp. 842-846
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
RRAM, conductive defect, cell thickness, reset current, set voltage, forming voltage, and low power, 
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