Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 586-591 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Scan Testing Keyword: hybrid BIST, n-detection test, partially rotational scan, low-speed tester,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/12/01 Vol. E86-ANo. 12pp. 3063-3071 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Timing Verification and Test Generation Keyword: BIST, LFSR, test-per-clock, test-per-scan, seed, polynomial,