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Efficient Block-Level Connectivity Verification Algorithms for Embedded Memories
Jin-Fu LI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A
No. 12
pp. 3185-3192
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword:
system on chip, embedded memories, verification, signal misplaced fault, | | | Summary | Full Text:PDF | |
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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin-Fu LI | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3
pp. 601-608
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword:
content addressable memories, testing, diagnosis, march test, | | | Summary | Full Text:PDF | |
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