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IEICE Trans

Isao HIGASHI

On Acceleration of Test Points Selection for Scan-Based BIST
Michinobu NAKAO Kazumi HATAYAMA Isao HIGASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 668-674
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Built-in Self-Test
Keyword: 
test points, BIST, optimization, testability, 
 Summary | Full Text:PDF