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IEICE Trans

Brion KELLER

Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression
Anis UZZAMAN Brion KELLER Brian FOUTZ Sandeep BHATIA Thomas BARTENSTEIN Masayuki ARAI Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 17-23
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
test compression, hybrid compression, volume diagnosis, ATPG, partial good chip, 
 Summary | Full Text:PDF