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IEICE Trans

Atsuhiro OGAWA

Test Generation for Test Compression Based on Statistical Coding
Hideyuki ICHIHARA Atsuhiro OGAWA Tomoo INOUE Akio TAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1466-1473
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
VLSI test, test compression, statistical code, test generation, automatic test equipment, 
 Summary | Full Text:PDF