Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D
No. 10
pp. 1466-1473
Type of Manuscript:
Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword:
VLSI test, test compression, statistical code, test generation, automatic test equipment, |
