Test Generation for Test Compression Based on Statistical Coding

Hideyuki ICHIHARA  Atsuhiro OGAWA  Tomoo INOUE  Akio TAMURA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E85-D   No.10   pp.1466-1473
Publication Date: 2002/10/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
VLSI test,  test compression,  statistical code,  test generation,  automatic test equipment,  

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Summary: 
Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.