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Total 44115 documents match your query. Current List: 40971 - 40980

Vol.E75-B No.9  pp.906-913
PAPER  Optical Communication
Characteristics of Mode Partition Noise of DFB LD's Induced by Externally Reflected Light
Takeshi KAWAI, Atsutaka KURIHARA, Masakazu MORI, Toshio GOTO, Akira MIYAUCHI, Takakiyo NAKAGAMI, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.971-971
FOREWORD  
FOREWORD
Hiroyuki MATSUNAMI, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.972-977
Special SectionPAPER  
Half-Micron LOCOS Isolation Using High Energy Ion Implantation
Koji SUZUKI, Kazunobu MAMENO, Hideharu NAGASAWA, Atsuhiro NISHIDA, Hideaki FUJIWARA, Kiyoshi YONEDA, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.978-985
Special SectionPAPER  
Characterization of a Silicon Wafer after the Removal of Photoresist Layer Using Two Lasers of Different Wavelengths
Akira USAMI, Hideki FUJIWARA, Takahisa NAKAI, Kazunori MATSUKI, Tsutomu TAKEUCHI, Takao WADA, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.986-989
Special SectionPAPER  
Quantitative Analysis of Submonolayer Si on Ge Surface by Isotope Dilution Secondary Ion Mass Spectrscopy
Izumi KAWASHIMA, Yasuo TAKAHASHI, Tsuneo URISU, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.990-994
Special SectionPAPER  
Evaluation of Surface Damage on a Silicon Wafer Induced by Reactive Ion Etching Using X-Ray Photoeloctron Spectroscopy and Electrical Characteristics
Akitaka MURATA, Morio NAKAMURA, Akira ASAI, Ichiro TANIGUCHI, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.995-1000
Special SectionPAPER  
Diffusion of Phosphorus in Poly/Single Crystalline Silicon
Hideaki FUJIWARA, Hideharu NAGASAWA, Atsuhiro NISHIDA, Koji SUZUKI, Kazunobu MAMENO, Kiyoshi YONEDA, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.1001-1006
Special SectionPAPER  
Characterization of Buried Si Atomic Structures by High-Energy Ion Scattering Technique
Eiji KAMIYA, Jong MOON, Toshimichi ITO, Akio HIRAKI, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.1007-1012
Special SectionPAPER  
Effects of the Gate Polycrystalline Silicon Film on the Characteristics of MOS Capacitor
Makoto AKIZUKI, Masaki HIRASE, Atsushi SAITA, Hiroyuki AOE, Atsumasa DOI, 
Summary | Full Text:PDF

Vol.E75-C No.9  pp.1013-1018
Special SectionPAPER  
Deposition of High-Quality Silicon Dioxide by Remote Plasma CVD Technique
Takashi FUYUKI, Takeshi FURUKAWA, Tohru OKA, Hiroyuki MATSUNAMI, 
Summary | Full Text:PDF

Current List: 40971 - 40980
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