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Vol.E77-A No.1
pp.174-179
Special SectionPAPER
Failure Physics and Failure Analysis
Focused Ion Beam Applications to Failure Analysis of Si Device Chip
Kiyoshi NIKAWA, |
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Vol.E77-A No.1
pp.180-186
Special SectionPAPER
Failure Physics and Failure Analysis
Barrier Metal Effect on Electro- and Stress-Migration
Tetsuaki WADA, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.187-194
Special SectionPAPER
Failure Physics and Failure Analysis
Via Electromigration Characteristics in Aluminum Based Multilevel Interconnection
Takahisa YAMAHA, Masaru NAITO, Tadahiko HOTTA, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.195-203
Special SectionPAPER
Reliability Testing
The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions
Kazunori HIRAOKA, Kazumitsu YASUDA, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.204-207
Special SectionPAPER
Reliability Testing
Evalution of the SO2 and NO2 Mixed Gas Tests for Electronic Parts
Sadao IDA, Atsumi KURAMOCHI, Hiroshi WATANABE, Mitsuhiko KOYAMA, Kazutoshi GOTO, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.208-212
Special SectionPAPER
Evaluation of Reliability Improvement
Long-Term Reliability Testing of Electric Double-Layer Capacitors
Munekazu AOKI, Kazuhiko SATO, Yoshihiro KOBAYASHI, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.213-219
Special SectionPAPER
Evaluation of Reliability Improvement
High Reliability Design Method of LC Tuning Circuit and Substantiation of Aging Characteristics for 20 Years
Mitsugi SAITA, Tatsuo YOSHIE, Katsumi WATANABE, Kiyoshi MURAMORI, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.220-227
Special SectionPAPER
Evaluation of Reliability Improvement
Improvement of Reliability of Large-Sized Ceramic Capacitors and Dummy Resistors for the High Power Transmitter
Tohru MIZOKAMI, Hiroki TAKAZAWA, Eiichi KAWABATA, Yuzi OGATA, Haruo OHTA, Kazuaki WAKAI, Kazuhisa HAYEIWA, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.228-236
Special SectionPAPER
Reliability and Safety
Optimal Redundancy of Systems for Minimizing the Probability of Dangerous Errors
Kyoichi NAKASHIMA, Hitoshi MATZNAGA, |
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Summary | Full Text:PDF | |
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Vol.E77-A No.1
pp.237-239
Special SectionLETTER
Reliability and Safety
Optimal Free-Sensors Allocation Problem in Safety Monitoring System
Kenji TANAKA, Keiko SAITOH, |
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Summary | Full Text:PDF | |
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Current List: 39791 - 39800
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